Roelof Hamberg

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	All	Since 2018
Citations	3250	490
h-index	16	9
i10-index	19	7

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huib de ridderDelft University of Technology, Delft, The NetherlandsVerified email at tudelft.nl
Wijnand IJsselsteijnProfessor Cognition and Affect in Human-Technology Interaction at Eindhoven University of TechnologyVerified email at tue.nl
Jacques VerrietESI (TNO)Verified email at tno.nl
Jonathan Freemani2 media research, Psychology, Goldsmiths University of LondonVerified email at gold.ac.uk
Twan BastenProfessor of Computational Models, Electrical Engineering, Eindhoven University of TechnologyVerified email at tue.nl
Søren BechProfessor Aalborg UniversitetVerified email at es.aau.dk
Jean-Bernard MartensEindhoven University of Technology, the NetherlandsVerified email at tue.nl
Frits W. VaandragerProfessor of Computer Science, Radboud UniversityVerified email at cs.ru.nl
Paris AvgeriouFull Professor of Software Engineering, University of GroningenVerified email at rug.nl
Christian ManteuffelUniversity of GroningenVerified email at rug.nl
Teun HendriksTNO, TeatownlakeVerified email at tno.nl
Tjerk BijlsmaTNO - Embedded Systems Inmnovations (The Netherlands)Verified email at tno.nl
Marcel van AmstelEindhoven University of TechnologyVerified email at alumnus.tue.nl
Mark van den BrandProfessor Software Engineering and Technology, Eindhoven University of TechnologyVerified email at tue.nl
Tetsuo TomiyamaVice President, Professor, International Professional University of Technology in TokyoVerified email at iput.ac.jp
j.e. roodahoogleraar Systems Engineering, Eindhoven University of TechnologyVerified email at tue.nl

Roelof Hamberg

Canon Production Printing

Verified email at cpp.canon

systems architecting systems modeling


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A complete calculation of the order αs2 correction to the Drell-Yan K-factor R Hamberg, WL Van Neerven, T Matsuura Nuclear Physics B 359 (2-3), 343-405, 1991	2111*	1991
Perceived depth and the feeling of presence in 3DTV W IJsselsteijn, H De Ridder, R Hamberg, D Bouwhuis, J Freeman Displays 18 (4), 207-214, 1998	318	1998
The correct renormalization of the gluon operator in a covariant gauge R Hamberg, WL van Neerven Nuclear Physics B 379 (1-2), 143-171, 1992	156	1992
The contribution of the gluon-gluon subprocess to the Drell-Yan <i>K</i>-factor T Matsuura, R Hamberg, WL van Neerven Nuclear Physics B 345 (2), 331-368, 1990	85	1990
Time-varying image quality: Modeling the relation between instantaneous and overall quality R Hamberg, H de Ridder SMPTE journal 108 (11), 802-811, 1999	83	1999
Continuous assessment of perceptual image quality R Hamberg, H de Ridder JOSA A 12 (12), 2573-2577, 1995	75	1995
Rapid perceptual image description (RaPID) method S Bech, R Hamberg, M Nijenhuis, K Teunissen, HL de Jong, P Houben, ... Human Vision and Electronic Imaging 2657, 317-328, 1996	55	1996
Automation in warehouse development R Hamberg Springer, 2012	49	2012
Continuous assessment of image quality H de Ridder, R Hamberg SMPTE journal 106 (2), 123-128, 1997	45	1997
Second order gluonic contributions to physical quantities R Hamberg Leiden: Rijksuniversiteit, 1991	34	1991
Perceptual factors in stereoscopic displays: the effect of stereoscopic filming parameters on perceived quaility and reported eyestrain WA IJsselsteijn, H de Ridder, R Hamberg Human Vision and Electronic Imaging III 3299, 282-291, 1998	32	1998
Model-based design of adaptive embedded systems T Basten, R Hamberg, F Reckers, J Verriet Springer, 2013	24	2013
Continuous assessment of time-varying image quality R Hamberg, H de Ridder Human Vision and Electronic Imaging II 3016, 248-259, 1997	22	1997
Continuous assessment of presence in stereoscopic displays WA IJsselsteijn, J Freeman, SE Avons, J Davidoff, HH Ridder, R Hamberg Perception 26, 42, 1997	21	1997
A complete calculation of the order α s 2 correction to the Drell-Yan K factor 1991 R Hamberg, WL van Neerven, T Matsuura Nucl. Phys. B 359 (343), 2, 0	20
A design framework for model-based development of complex systems H Moneva, R Hamberg, T Punter 32nd IEEE Real-Time Systems Symposium 2nd Analytical Virtual Integration of …, 2011	16	2011
Warehouse simulation through model configuration J Verriet, R Hamberg, J Caarls, B van Wijngaarden ECMS, 629-635, 2013	13	2013
Sharpness, sharpness related attributes, and their physical correlates M Nijenhuis, R Hamberg, C Teunissen, S Bech, HL de Jong, P Houben, ... Proceedings of SPIE 3025, 173-184, 1997	11	1997
Using model checkers in an introductory course on operating systems R Hamberg, F Vaandrager ACM SIGOPS Operating Systems Review 42 (6), 101-111, 2008	10	2008
An exploratory case study on reusing architecture decisions in software-intensive system projects C Manteuffel, P Avgeriou, R Hamberg Journal of Systems and Software 144, 60-83, 2018	9	2018

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