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R F Egerton
R F Egerton
Emeritus Professor, University of Alberta
Verified email at ualberta.ca - Homepage
Title
Cited by
Cited by
Year
Electron energy-loss spectroscopy in the electron microscope
RF Egerton
Springer Science & Business Media, 2011
72942011
Radiation damage in the TEM and SEM
RF Egerton, P Li, M Malac
Micron 35 (6), 399-409, 2004
23052004
Physical principles of electron microscopy
RF Egerton
Springer, 2005
19552005
Electron energy-loss spectroscopy in the TEM
RF Egerton
Reports on Progress in Physics 72 (1), 016502, 2008
10522008
EELS log‐ratio technique for specimen‐thickness measurement in the TEM
T Malis, SC Cheng, RF Egerton
Journal of electron microscopy technique 8 (2), 193-200, 1988
9911988
Vibrational spectroscopy in the electron microscope
OL Krivanek, TC Lovejoy, N Dellby, T Aoki, RW Carpenter, P Rez, ...
Nature 514 (7521), 209-212, 2014
7312014
Energy-filtering transmission electron microscopy
C Deininger, RF Egerton, F Hofer, B Jouffrey, D Krahl, RD Leapman, ...
Springer, 2013
4442013
Control of radiation damage in the TEM
RF Egerton
Ultramicroscopy 127, 100-108, 2013
3772013
Radiation damage to organic and inorganic specimens in the TEM
RF Egerton
Micron 119, 72-87, 2019
3132019
Mechanisms of radiation damage in beam‐sensitive specimens, for TEM accelerating voltages between 10 and 300 kV
RF Egerton
Microscopy research and technique 75 (11), 1550-1556, 2012
3012012
Basic questions related to electron-induced sputtering in the TEM
RF Egerton, R McLeod, F Wang, M Malac
Ultramicroscopy 110 (8), 991-997, 2010
2842010
K-shell ionization cross-sections for use in microanalysis
RF Egerton
Ultramicroscopy 4 (2), 169-179, 1979
2771979
Inelastic scattering of 80 keV electrons in amorphous carbon
RF Egerton
Philosophical Magazine 31 (1), 199-215, 1975
2291975
Bandlike transport in pentacene and functionalized pentacene thin films revealed by subpicosecond transient photoconductivity measurements
O Ostroverkhova, DG Cooke, S Shcherbyna, RF Egerton, FA Hegmann, ...
Physical Review B 71 (3), 035204, 2005
2132005
Limits to the spatial, energy and momentum resolution of electron energy-loss spectroscopy
RF Egerton
Ultramicroscopy 107 (8), 575-586, 2007
2072007
Formulae for light-element micro analysis by electron energy-loss spectrometry
RF Egerton
Ultramicroscopy 3, 243-251, 1978
2021978
Measurement of local thickness by electron energy-loss spectroscopy
RF Egerton, SC Cheng
Ultramicroscopy 21 (3), 231-244, 1987
1801987
Optical and transient photoconductive properties of pentacene and functionalized pentacene thin films: Dependence on film morphology
O Ostroverkhova, S Shcherbyna, DG Cooke, RF Egerton, FA Hegmann, ...
Journal of Applied Physics 98 (3), 2005
1662005
Choice of operating voltage for a transmission electron microscope
RF Egerton
Ultramicroscopy 145, 85-93, 2014
1632014
Fabrication of submicrometer regular arrays of pillars and helices
M Malac, RF Egerton, MJ Brett, B Dick
Journal of Vacuum Science & Technology B: Microelectronics and Nanometer …, 1999
1471999
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