| Optimal selective Huffman coding for test-data compression X Kavousianos, E Kalligeros, D Nikolos IEEE transactions on computers 56 (8), 1146-1152, 2007 | 163 | 2007 |
| Thwarting all logic locking attacks: Dishonest oracle with truly random logic locking N Limaye, E Kalligeros, N Karousos, IG Karybali, O Sinanoglu IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2020 | 87 | 2020 |
| Multilevel Huffman coding: An efficient test-data compression method for IP cores X Kavousianos, E Kalligeros, D Nikolos IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2007 | 66 | 2007 |
| Test data compression based on variable-to-variable Huffman encoding with codeword reusability X Kavousianos, E Kalligeros, D Nikolos IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2008 | 52 | 2008 |
| Multilevel-Huffman Test-Data Compression for IP Cores with Multiple Scan Chains X Kavousianos, E Kalligeros, D Nikolos Very Large Scale Integration (VLSI) Systems, IEEE Transactions on 16 (7 …, 2008 | 48 | 2008 |
| Multiphase BIST: A new reseeding technique for high test-data compression E Kalligeros, X Kavousianos, D Nikolos IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2004 | 33 | 2004 |
| Weighted logic locking: a new approach for IC piracy protection N Karousos, K Pexaras, IG Karybali, E Kalligeros 2017 IEEE 23rd International Symposium on On-Line Testing and Robust System …, 2017 | 32 | 2017 |
| State skip LFSRs: Bridging the gap between test data compression and test set embedding for IP cores V Tenentes, X Kavousianos, E Kalligeros Proceedings of the conference on Design, automation and test in Europe, 474-479, 2008 | 30 | 2008 |
| An efficient seeds selection method for LFSR-based test-per-clock BIST E Kalligeros, X Kavousianos, D Bakalis, D Nikolos Proceedings International Symposium on Quality Electronic Design, 261-266, 2002 | 30 | 2002 |
| Single and variable-state-skip LFSRs: bridging the gap between test data compression and test set embedding for IP cores V Tenentes, X Kavousianos, E Kalligeros IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2010 | 28 | 2010 |
| Merged switch allocation and traversal in network-on-chip switches G Dimitrakopoulos, E Kalligeros, K Galanopoulos IEEE Transactions on Computers 62 (10), 2001-2012, 2012 | 27 | 2012 |
| Reseeding-based test set embedding with reduced test sequences E Kalligeros, D Kaseridis, X Kavousianos, D Nikolos Sixth international symposium on quality electronic design (isqed'05), 226-231, 2005 | 26 | 2005 |
| On-the-fly reseeding: A new reseeding technique for test-per-clock BIST E Kalligeros, X Kavousianos, D Bakalis, D Nikolos Journal of Electronic Testing 18, 315-332, 2002 | 25 | 2002 |
| New reseeding technique for LFSR-based test pattern generation E Kalligeros, X Kavousianos, D Bakalis, D Nikolos Proceedings Seventh International On-Line Testing Workshop, 80-86, 2001 | 23 | 2001 |
| Lawris: A rule-based Arduino programming system for young students S Arakliotis, DG Nikolos, E Kalligeros 2016 5th International Conference on Modern Circuits and Systems …, 2016 | 21 | 2016 |
| ElastiNoC: A self-testable distributed VC-based network-on-chip architecture I Seitanidis, A Psarras, E Kalligeros, C Nicopoulos, G Dimitrakopoulos 2014 Eighth IEEE/ACM International Symposium on Networks-on-Chip (NoCS), 135-142, 2014 | 21 | 2014 |
| Optimization and hardware implementation of image and video watermarking for low-cost applications K Pexaras, IG Karybali, E Kalligeros IEEE Transactions on Circuits and Systems I: Regular Papers 66 (6), 2088-2101, 2019 | 20 | 2019 |
| Defect-oriented LFSR reseeding to target unmodeled defects using stuck-at test sets X Kavousianos, V Tenentes, K Chakrabarty, E Kalligeros IEEE transactions on very large scale integration (VLSI) systems 19 (12 …, 2010 | 18 | 2010 |
| Scalable arbiters and multiplexers for on-FGPA interconnection networks G Dimitrakopoulos, C Kachris, E Kalligeros 2011 21st International Conference on Field Programmable Logic and …, 2011 | 12 | 2011 |
| An efficient test set embedding scheme with reduced test data storage and test sequence length requirements for scan-based testing D Kaseridis, E Kalligeros, X Kavousianos, D Nikolos Informal Digest of Papers of IEEE European Test Symposium (ETS), 147-150, 2005 | 12 | 2005 |
Xrysovalantis KavousianosUniversity of IoanninaVerified email at cs.uoi.gr
