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Paul Voyles
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Atomic-scale imaging of individual dopant atoms and clusters in highly n-type bulk Si
PM Voyles, DA Muller, JL Grazul, PH Citrin, HJL Gossmann
Nature 416 (6883), 826-829, 2002
5332002
H2V3O8 Nanowire/Graphene Electrodes for Aqueous Rechargeable Zinc Ion Batteries with High Rate Capability and Large Capacity
Q Pang, C Sun, Y Yu, K Zhao, Z Zhang, PM Voyles, G Chen, Y Wei, ...
Advanced Energy Materials 8 (19), 1800144, 2018
4752018
Picometre-precision analysis of scanning transmission electron microscopy images of platinum nanocatalysts
AB Yankovich, B Berkels, W Dahmen, P Binev, SI Sanchez, SA Bradley, ...
Nature communications 5 (1), 4155, 2014
3172014
Imaging individual atoms inside crystals with ADF-STEM
PM Voyles, JL Grazul, DA Muller
Ultramicroscopy 96 (3-4), 251-273, 2003
2892003
Stabilization of copper catalysts for liquid‐phase reactions by atomic layer deposition
BJ O'Neill, DHK Jackson, AJ Crisci, CA Farberow, F Shi, AC Alba‐Rubio, ...
Angewandte Chemie 125 (51), 14053-14057, 2013
2342013
Morphology and crystallization kinetics in thin films grown by atomic layer deposition
MY Ho, H Gong, GD Wilk, BW Busch, ML Green, PM Voyles, DA Muller, ...
Journal of Applied Physics 93 (3), 1477-1481, 2003
2252003
Nanoscale Structure and Structural Relaxation in Bulk Metallic Glass
J Hwang, ZH Melgarejo, YE Kalay, I Kalay, MJ Kramer, DS Stone, ...
Physical review letters 108 (19), 195505, 2012
2142012
Evaluation of connectivity, flux pinning, and upper critical field contributions to the critical current density of bulk pure and SiC-alloyed MgB2
A Matsumoto, H Kumakura, H Kitaguchi, BJ Senkowicz, MC Jewell, ...
Applied physics letters 89 (13), 2006
1772006
Fluctuation microscopy in the STEM
PM Voyles, DA Muller
Ultramicroscopy 93 (2), 147-159, 2002
1672002
Atom pair persistence in disordered materials from fluctuation microscopy
JM Gibson, MMJ Treacy, PM Voyles
Ultramicroscopy 83 (3-4), 169-178, 2000
1542000
High‐performance, quantum dot nanocomposites for nonlinear optical and optical gain applications
MA Petruska, AV Malko, PM Voyles, VI Klimov
Advanced Materials 15 (7‐8), 610-613, 2003
1532003
Total reaction and 2n-removal cross sections of 20–60A MeV , , and on Si
RE Warner, RA Patty, PM Voyles, A Nadasen, FD Becchetti, JA Brown, ...
Physical Review C 54 (4), 1700, 1996
1511996
Tm3Fe5O12/Pt Heterostructures with Perpendicular Magnetic Anisotropy for Spintronic Applications
A Quindeau, CO Avci, W Liu, C Sun, M Mann, AS Tang, MC Onbasli, ...
Advanced Electronic Materials 3 (1), 1600376, 2017
1482017
Fast flexible electronics with strained silicon nanomembranes
H Zhou, JH Seo, DM Paskiewicz, Y Zhu, GK Celler, PM Voyles, W Zhou, ...
Scientific reports 3 (1), 1291, 2013
1452013
Fluctuation microscopy: a probe of atomic correlations in disordered materials
PM Voyles, JM Gibson, MMJ Treacy
Microscopy 49 (2), 259-266, 2000
1362000
Quantitative measurement of density in a shear band of metallic glass monitored along its propagation direction
V Schmidt, H Rösner, M Peterlechner, G Wilde, PM Voyles
Physical review letters 115 (3), 035501, 2015
1352015
Influence of film composition in quaternary Heusler alloy Co2 (Mn, Fe) Si thin films on tunnelling magnetoresistance of Co2 (Mn, Fe) Si/MgO-based magnetic tunnel junctions
H Liu, T Kawami, K Moges, T Uemura, M Yamamoto, F Shi, PM Voyles
Journal of Physics D: Applied Physics 48 (16), 164001, 2015
1312015
Aluminum nanoscale order in amorphous Al92Sm8 measured by fluctuation electron microscopy
WG Stratton, J Hamann, JH Perepezko, PM Voyles, X Mao, SV Khare
Applied Physics Letters 86 (14), 2005
1312005
Structure and physical properties of paracrystalline atomistic models of amorphous silicon
PM Voyles, N Zotov, SM Nakhmanson, DA Drabold, JM Gibson, ...
Journal of Applied Physics 90 (9), 4437-4451, 2001
1242001
Medium-range order in amorphous silicon measured by fluctuation electron microscopy
PM Voyles, JR Abelson
Solar energy materials and solar cells 78 (1-4), 85-113, 2003
1202003
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