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Co-authors
- Karl K. BerggrenProfessor of Electrical Engineering, MITVerified email at mit.edu
- Sae Woo NamNISTVerified email at nist.gov
- Sonia BuckleyPhysicist at NIST, BoulderVerified email at nist.gov
- Qing-Yuan Zhao (赵清源)Professor, Nanjing UniversityVerified email at nju.edu.cn
- Jeffrey ShainlinePhysicist / Staff Scientist at NIST, BoulderVerified email at nist.gov
- Richard MirinNISTVerified email at nist.gov
- Andrew DaneIBMVerified email at ibm.com
- Jeff ChilesPhysicist, NISTVerified email at nist.gov
- Alexander TaitAssistant Professor, Queen's UniversityVerified email at queensu.ca
- Faraz NajafiMassachusetts Institute of TechnologyVerified email at mit.edu
- Emily ToomeyMicrosoft Station QVerified email at microsoft.com
- niccolò CalandriPolitecnico di MilanoVerified email at polimi.it
- Bakhrom G. OripovNIST / Colorado UniversityVerified email at nist.gov
- Di ZhuNational University of Singapore (NUS) and A*STARVerified email at nus.edu.sg
- Yachin IvryTechnion - Israeli Institute of TechnologyVerified email at technion.ac.il
- Nathnael S AbebePhD Student, StanfordVerified email at stanford.edu
- Domenico De FazioCa' Foscari University of VeniceVerified email at unive.it
- Chung-Soo KimKorea Institute of Industrial Technology (KITECH)Verified email at kitech.re.kr
- Michael SchneiderNISTVerified email at nist.gov
- Daniel SantaviccaUniversity of North FloridaVerified email at unf.edu