| EELS log‐ratio technique for specimen‐thickness measurement in the TEM T Malis, SC Cheng, RF Egerton Journal of electron microscopy technique 8 (2), 193-200, 1988 | 999 | 1988 |
| Stabilization of cubic AlN in epitaxial AlN/TiN superlattices A Madan, IW Kim, SC Cheng, P Yashar, VP Dravid, SA Barnett Physical Review Letters 78 (9), 1743, 1997 | 334 | 1997 |
| Synthesis of superhard carbon nitride composite coatings D Li, X Chu, SC Cheng, XW Lin, VP Dravid, YW Chung, MS Wong, ... Applied Physics Letters 67 (2), 203-205, 1995 | 207 | 1995 |
| Measurement of local thickness by electron energy-loss spectroscopy RF Egerton, SC Cheng Ultramicroscopy 21 (3), 231-244, 1987 | 180 | 1987 |
| Structure and hardness studies of CNx/TiN nanocomposite coatings D Li, XW Lin, SC Cheng, VP Dravid, YW Chung, MS Wong, WD Sproul Applied Physics Letters 68 (9), 1211-1213, 1996 | 162 | 1996 |
| Epitaxial growth of anisotropically shaped, single-crystal particles of cubic SrTiO3 K Watari, B Brahmaroutu, GL Messing, S Trolier-McKinstry, SC Cheng Journal of Materials Research 15, 846-849, 2000 | 77 | 2000 |
| Characterization and use of the Gatan 666 parallel-recording electron energy-loss spectrometer RF Egerton, YY Yang, SC Cheng Ultramicroscopy 48 (3), 239-250, 1993 | 53 | 1993 |
| Characterization of an analytical electron microscope with a NiO test specimen RF Egerton, SC Cheng Ultramicroscopy 55 (1), 43-54, 1994 | 46 | 1994 |
| Characteristics of amorphous and polycrystalline silicon films deposited at 120° C by electron cyclotron resonance plasma-enhanced chemical vapor deposition S Bae, AK Kalkan, S Cheng, SJ Fonash Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films 16 (3 …, 1998 | 36 | 1998 |
| Single-crystal silicon films on glass KP Gadkaree, K Soni, SC Cheng, C Kosik-Williams Journal of Materials Research 22, 2363-2367, 2007 | 31 | 2007 |
| Momentum-transfer resolved electron energy loss spectroscopy of solids: problems, solutions and applications YY Wang, SC Cheng, VP Dravid, FC Zhang Ultramicroscopy 59 (1-4), 109-119, 1995 | 25 | 1995 |
| The core-shell structure in ultrafine X7R dielectric ceramics X Liu, S Cheng, CA Randall Journal of the Korean Physical Society 32 (SUPPL. 1), S312-S315, 1998 | 21 | 1998 |
| Use of EELS to study the absorption edge of fused silica SC Cheng, SL Schiefelbein, LA Moore, M Pierson-Stull, CM Smith, S Sen Journal of non-crystalline solids 352 (28-29), 3140-3146, 2006 | 19 | 2006 |
| Band-tail photoluminescence in nanocrystalline Si AK Kalkan, SJ Fonash, SC Cheng Applied Physics Letters 77 (1), 55-57, 2000 | 16 | 2000 |
| A nano-flake model for the medium range structure in vitreous silica S Cheng Physics and Chemistry of Glasses-European Journal of Glass Science and …, 2017 | 15 | 2017 |
| Coordination and optical attenuation of TiO2–SiO2 glass by electron energy loss spectroscopy SC Cheng Journal of non-crystalline solids 354 (31), 3735-3741, 2008 | 15 | 2008 |
| Determination of the valence of Pr in () superconducting compounds by electron-energy-loss spectroscopy SC Cheng, VP Dravid, TJ Goodwin, RN Shelton, HB Radousky Physical Review B 53 (17), 11779, 1996 | 13 | 1996 |
| Elemental analysis of thick amorphous specimens by EELS SC Cheng, RF Egerton Micron 24 (3), 251-256, 1993 | 13 | 1993 |
| New interpretation of X-ray diffraction pattern of vitreous silica S Cheng Ceramics 4 (1), 83-96, 2021 | 12 | 2021 |
| J. Vac. Sci. Technol. A C Bae, AK Kalkan, S Cheng, SJ Fonash J. Vac. Sci. Technol. A 22, 2379, 2004 | 11 | 2004 |
